Werner Frammelsberger

Statistics

Publications

Citations

419

H-Index

Active since

2003

Affiliations

Deggendorf Institute of Technology(Current)

Universitat Autònoma de Barcelona

Infineon Technologies (Germany)

University of the West of England

Soochow University

Werner Frammelsberger is an author at Deggendorf Institute of Technology specializing in materials science, natural sciences, and atomic force microscopy.

ORCID

Publications per year

2003–2023

Publications

C-AFM-based thickness determination of thin and ultra-thin SiO 2 films by use of different conductive-coated probe tips

Werner Frammelsberger, Günther Benstetter, Janice Kiely et al. · Applied Surface Science · 2006 · 100 citations

Natural Sciences, Materials Engineering, Materials Science +15

Dielectric Properties of Ultrathin CaF<sub>2</sub> Ionic Crystals

Chao Wen, A. G. Banshchikov, Yu. Yu. Illarionov et al. · Advanced Materials · 2020 · 77 citations

Natural Sciences, Materials Engineering, Materials Science +17

Thickness determination of thin and ultra-thin SiO2 films by C-AFM IV-spectroscopy

Werner Frammelsberger, Günther Benstetter, Janice Kiely et al. · Applied Surface Science · 2005 · 54 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +12

The effect of the surface layer of tetrahedral amorphous carbon films on their tribological and electron emission properties investigated by atomic force microscopy

Dongping Liu, Günther Benstetter, Werner Frammelsberger · Applied Physics Letters · 2003 · 33 citations

Natural Sciences, Materials Engineering, Materials Science +17

Influence of the manufacturing process on the electrical properties of thin (<4nm) Hafnium based high-k stacks observed with CAFM

Mario Lanza, M. Porti, M. Nafrı́a et al. · Microelectronics Reliability · 2007 · 30 citations

Natural Sciences, Materials Engineering, Materials Science +10

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