Daewon Ha

Extremely scaled silicon nano-CMOS devices

Leland Chang, Yang‐Kyu Choi, Daewon Ha et al. · Proceedings of the IEEE · 2003 · 279 citations

Electrical Engineering, Engineering, Microfabrication +15

Observation of bulk HfO2 defects by spectroscopic ellipsometry

Hideki Takeuchi, Daewon Ha, Tsu‐Jae King · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2004 · 247 citations

Engineering, Silicon On Insulator, Spectroscopic Property +19

Sub-20 nm CMOS FinFET technologies

Yang‐Kyu Choi, N. Lindert, Peiqi Xuan et al. · 2002 · 194 citations

Low-power Electronics, Electrical Engineering, Semiconductor Device +10

FinFET process refinements for improved mobility and gate work function engineering

Yang‐Kyu Choi, Leland Chang, P. Ranade et al. · 2003 · 105 citations

Device Modeling, Electrical Engineering, Physical Design (Electronics) +15

Two-bit cell operation in diode-switch phase change memory cells with 90nm technology

Dong‐Soo Kang, Ji‐Hyun Lee, J.H. Kong et al. · 2008 · 96 citations

Non-volatile Memory, Engineering, Emerging Memory Technology +16