Manasa Medikonda

Multi-technique x-ray and optical characterization of crystalline phase, texture, and electronic structure of atomic layer deposited Hf1−xZrxO2 gate dielectrics deposited by a cyclical deposition and annealing scheme

Relja Vasić, Steven Consiglio, Robert D. Clark et al. · Journal of Applied Physics · 2013 · 26 citations

Natural Sciences, Materials Engineering, Materials Science +17

Fabrication of 5-20 nm thick <i>β</i>-W films

Avyaya J. Narasimham, Manasa Medikonda, Akitomo Matsubayashi et al. · AIP Advances · 2014 · 24 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Effects of stress on the dielectric function of strained pseudomorphic Si1−xGex alloys from 0 to 75% Ge grown on Si (001)

Gangadhara Raja Muthinti, Manasa Medikonda, Thomas Adam et al. · Journal of Applied Physics · 2012 · 22 citations

Natural Sciences, Materials Engineering, Materials Science +17

Mueller based scatterometry measurement of nanoscale structures with anisotropic in-plane optical properties

Gangadhara Raja Muthinti, Manasa Medikonda, Jody Fronheiser et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2013 · 17 citations

Engineering, Electrical Engineering, Materials Science +17

Optical properties of pseudomorphic Ge1−xSnx (x = 0 to 0.11) alloys on Ge(001)

Manasa Medikonda, Gangadhara Raja Muthinti, Relja Vasić et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2014 · 14 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17