Jingxin Jiang

Quantitative Analysis of the Effect of Hydrogen Diffusion from Silicon Oxide Etch-Stopper Layer into Amorphous In–Ga–Zn–O on Thin-Film Transistor

Tatsuya Toda, Deapeng Wang, Jingxin Jiang et al. · IEEE Transactions on Electron Devices · 2014 · 104 citations

Engineering, Electrical Engineering, Materials Science +17

Negative Bias and Illumination Stress Induced Electron Trapping at Back-Channel Interface of InGaZnO Thin-Film Transistor

Mai Phi Hung, Dapeng Wang, Jingxin Jiang et al. · ECS Solid State Letters · 2014 · 53 citations

Engineering, Electrical Engineering, Materials Science +14

Highly stable fluorine-passivated In–Ga–Zn–O thin-film transistors under positive gate bias and temperature stress

Jingxin Jiang, Tatsuya Toda, Mai Phi Hung et al. · Applied Physics Express · 2014 · 45 citations

Engineering, Electrical Engineering, Materials Science +17

Self-Aligned Bottom-Gate In—Ga—Zn—O Thin-Film Transistor With Source/Drain Regions Formed by Direct Deposition of Fluorinated Silicon Nitride

Jingxin Jiang, Mamoru Furuta, Dapeng Wang · IEEE Electron Device Letters · 2014 · 32 citations

Engineering, Electrical Engineering, Materials Science +14

Investigation of Carrier Generation Mechanism in Fluorine-Doped n⁺-In–Ga–Zn-O for Self-Aligned Thin-Film Transistors

Dapeng Wang, Jingxin Jiang, Mamoru Furuta · Journal of Display Technology · 2015 · 27 citations

Engineering, Materials Engineering, Materials Science +17