Mai Phi Hung

Quantitative Analysis of the Effect of Hydrogen Diffusion from Silicon Oxide Etch-Stopper Layer into Amorphous In–Ga–Zn–O on Thin-Film Transistor

Tatsuya Toda, Deapeng Wang, Jingxin Jiang et al. · IEEE Transactions on Electron Devices · 2014 · 101 citations

Materials Science, Semiconductor Technology, Electrical Engineering +14

Negative Bias and Illumination Stress Induced Electron Trapping at Back-Channel Interface of InGaZnO Thin-Film Transistor

Mai Phi Hung, Dapeng Wang, Jingxin Jiang et al. · ECS Solid State Letters · 2014 · 53 citations

Electrical Engineering, Engineering, Physics +14

Highly stable fluorine-passivated In–Ga–Zn–O thin-film transistors under positive gate bias and temperature stress

Jingxin Jiang, Tatsuya Toda, Mai Phi Hung et al. · Applied Physics Express · 2014 · 44 citations

Thin-film Transistor, Engineering, Fluorine Diffusion +16

Off-current reduction in p-type SnO thin film transistors

Mai Phi Hung, Jan Genoe, Paul Heremans et al. · Applied Physics Letters · 2018 · 43 citations

Semiconductors, Materials Science, Electrical Engineering +15

Suppression of Degradation Induced by Negative Gate Bias and Illumination Stress in Amorphous InGaZnO Thin-Film Transistors by Applying Negative Drain Bias

Dapeng Wang, Mai Phi Hung, Jingxin Jiang et al. · ACS Applied Materials & Interfaces · 2014 · 26 citations

Negative Gate Bias, Electrical Engineering, Engineering +14