P. E. Russell

Scanning probe tips formed by focused ion beams

M. J. Vasile, D. A. Grigg, J. E. Griffith et al. · Review of Scientific Instruments · 1991 · 73 citations

Natural Sciences, Materials Engineering, Materials Science +11

The fibrillar hierarchy in liquid crystalline polymers

Linda C. Sawyer, R. T. Chen, M. G. Jamieson et al. · Journal of Materials Science · 1993 · 72 citations

Natural Sciences, Biophysics, Materials Science +14

Scanning probe tip geometry optimized for metrology by focused ion beam ion milling

M. J. Vasile, D. A. Grigg, J. E. Griffith et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1991 · 68 citations

Engineering, Materials Engineering, Materials Science +16

H2O enhanced focused ion beam micromachining

T. J. Stark, G. M. Shedd, Jim Vitarelli et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1995 · 53 citations

Engineering, Materials Engineering, Materials Science +14

Characterization of scanning probe microscope tips for linewidth measurement

J. E. Griffith, D. A. Grigg, M. J. Vasile et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1991 · 47 citations

Engineering, Materials Science, Instrumentation +10