G.J. Dunn

Channel hot-carrier stressing of reoxidized nitrided silicon dioxide

G.J. Dunn, Shelley A. Scott · IEEE Transactions on Electron Devices · 1990 · 78 citations

Engineering, Electrical Engineering, Materials Science +17

Direct observation of interfacial point defects generated by channel hot hole injection in <i>n</i>-channel metal oxide silicon field effect transistors

John Krick, Patrick M. Lenahan, G.J. Dunn · Applied Physics Letters · 1991 · 77 citations

Engineering, Electrical Engineering, Materials Science +17

Atomic hydrogen-induced interface degradation of reoxidized-nitrided silicon dioxide on silicon

E. Cartier, D. A. Buchanan, G.J. Dunn · Applied Physics Letters · 1994 · 75 citations

Engineering, Materials Engineering, Materials Science +13

Channel hot-carrier stressing of reoxidized nitrided oxide p-MOSFETs

G.J. Dunn, John Krick · IEEE Transactions on Electron Devices · 1991 · 53 citations

Engineering, Electrical Engineering, Materials Science +17

Reoxidized nitrided oxide for radiation-hardened MOS devices

G.J. Dunn, P.W. Wyatt · IEEE Transactions on Nuclear Science · 1989 · 51 citations

Engineering, Electrical Engineering, Materials Science +17