Concepedia

L.H. Weiland

LW

Statistics

Publications

12

Citations

181

H-Index

10

Active since

1953

Affiliations

Karlsruhe Institute of Technology(Current)

PDF Solutions (United States)

Toshiba (Japan)

L.H. Weiland is an author at Karlsruhe Institute of Technology specializing in engineering, computer engineering, and defect characterization.

Publications per year

1953–2003

12

Publications

12

Extraction of wafer-level defect density distributions to improve yield prediction

Christopher P. Hess, L.H. Weiland · IEEE Transactions on Semiconductor Manufacturing · 1999 · 24 citations

Engineering, Computer Engineering, Manufacturing Engineering +15

Logic characterization vehicle to determine process variation impact on yield and performance of digital circuits

Christopher P. Hess, B.E. Stine, L.H. Weiland et al. · 2003 · 24 citations

Engineering, Computer Engineering, Computer Science +17

Modeling of test structures for efficient online defect monitoring using a digital tester

Christopher P. Hess, L.H. Weiland · 2002 · 21 citations

Engineering, Computer Science, Manufacturing Engineering +13

Fast extraction of defect size distribution using a single layer short flow NEST structure

Christopher P. Hess, D. Stashower, B.E. Stine et al. · IEEE Transactions on Semiconductor Manufacturing · 2001 · 18 citations

Engineering, Computer Engineering, Electrical Engineering +16

Passive multiplexer test structure for fast and accurate contact and via fail-rate evaluation

Christopher P. Hess, B.E. Stine, L.H. Weiland et al. · IEEE Transactions on Semiconductor Manufacturing · 2003 · 16 citations

Engineering, Computer Engineering, Electrical Engineering +11

1–5 of 12