Concepedia

D. Stashower

DS

Statistics

Publications

2

Citations

28

H-Index

2

Active since

2001

Affiliations

Toshiba (Japan)(Current)

PDF Solutions (United States)

D. Stashower is an author at Toshiba (Japan) specializing in fault detection, device characterization, and yield enhancement.

Publications per year

2001–2002

2

Publications

2

Fast extraction of defect size distribution using a single layer short flow NEST structure

Christopher P. Hess, D. Stashower, B.E. Stine et al. · IEEE Transactions on Semiconductor Manufacturing · 2001 · 18 citations

, , +16

Fast extraction of killer defect density and size distribution using a single layer short flow NEST structure

Christopher P. Hess, D. Stashower, B.E. Stine et al. · 2002 · 10 citations

, , +17

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