S. Addepalli

A 130.7mm<sup>2</sup> 2-layer 32Gb ReRAM memory device in 24nm technology

Tz-yi Liu, Tian Hong Yan, R.E. Scheuerlein et al. · 2013 · 117 citations

Engineering, Computer Engineering, Electrical Engineering +9

Hafnium interdiffusion studies from hafnium silicate into silicon

Manuel Quevedo-López, M. El-Bouanani, S. Addepalli et al. · Applied Physics Letters · 2001 · 80 citations

Natural Sciences, Materials Engineering, Materials Science +17

STM atomic-scale characterization of the γ′-Al2O3 film on Ni3Al(111)

S. Addepalli, B. Ekstrom, N.P. Magtoto et al. · Surface Science · 1999 · 53 citations

Natural Sciences, Materials Science, Physics +10

Thermally induced Zr incorporation into Si from zirconium silicate thin films

Manuel Quevedo-López, M. El-Bouanani, S. Addepalli et al. · Applied Physics Letters · 2001 · 37 citations

Engineering, Materials Engineering, Materials Science +17

Dielectric breakdown of ultrathin aluminum oxide films induced by scanning tunneling microscopy

N.P. Magtoto, Chunping Niu, B. Ekstrom et al. · Applied Physics Letters · 2000 · 33 citations

Natural Sciences, Materials Engineering, Materials Science +17