G.J. Grula

Stress induced defects and transistor leakage for shallow trench isolated SOI

J.W. Sleight, Chnan Lin, G.J. Grula · IEEE Electron Device Letters · 1999 · 34 citations

Electrical Engineering, Engineering, Stress-induced Leakage Current +12

LOCOS-induced stress effects on thin-film SOI devices

Cheng-Liang Huang, H. Rahimpour Soleimani, G.J. Grula et al. · IEEE Transactions on Electron Devices · 1997 · 32 citations

Materials Science, Stress Phenomenon, Electrical Engineering +14

Isolation process dependence of channel mobility in thin-film SOI devices

Cheng‐Liang Huang, H. Rahimpour Soleimani, G.J. Grula et al. · IEEE Electron Device Letters · 1996 · 22 citations

Electrical Engineering, Engineering, Nanoelectronics +14

A 2.0 V, 0.35 μm partially depleted SOI-CMOS technology

K. Mistry, G.J. Grula, J.W. Sleight et al. · 2002 · 21 citations

Low-power Electronics, M Sram Yield, Electrical Engineering +13

Parasitic bipolar gain reduction and the optimization of 0.25-μm partially depleted SOI MOSFETs

K. Mistry, J.W. Sleight, G.J. Grula et al. · IEEE Transactions on Electron Devices · 1999 · 20 citations

Electrical Engineering, Engineering, Channel Doping +10