R. Williams

Record RF performance of 45-nm SOI CMOS Technology

Sungjae Lee, B. Jagannathan, Shreesh Narasimha et al. · 2007 · 179 citations

Engineering, Electrical Engineering, Microelectronics +16

Modeling of Variation in Submicrometer CMOS ULSI Technologies

S. Springer, Sunghoon Lee, Ning Lu et al. · IEEE Transactions on Electron Devices · 2006 · 79 citations

Engineering, Electrical Engineering, Microelectronics +16

FinFET SRAM for high-performance low-power applications

R. Williams, E. Nowak, K. Kim et al. · 2004 · 43 citations

Engineering, Computer Engineering, Electrical Engineering +16

Electrostatic discharge protection in silicon-on-insulator technology

Steven H. Voldman, David Hui, L. Warriner et al. · 2003 · 36 citations

Engineering, Electrical Engineering, Microelectronics +16

A High-Performance, Low Leakage, and Stable SRAM Row-Based Back-Gate Biasing Scheme in FinFET Technology

Rajiv Joshi, Keunwoo Kim, R. Williams et al. · 2007 · 29 citations

Engineering, Computer Engineering, Electrical Engineering +17