David Tio Castro

Evidence of the Thermo-Electric Thomson Effect and Influence on the Program Conditions and Cell Optimization in Phase-Change Memory Cells

David Tio Castro, L. Goux, G.A.M. Hurkx et al. · 2007 · 54 citations

Engineering, Phase Change Memory, Refrigeration +18

Degradation of the Reset Switching During Endurance Testing of a Phase-Change Line Cell

Ludovic Goux, David Tio Castro, G.A.M. Hurkx et al. · IEEE Transactions on Electron Devices · 2009 · 47 citations

Endurance Lifetime, Electrical Engineering, Engineering +11

0.8 μW 12-bit SAR ADC sensors interface for RFID applications

Daniela De Venuto, David Tio Castro, Y.V. Ponomarev et al. · Microelectronics Journal · 2010 · 31 citations

Low power 12-bit SAR ADC for autonomous wireless sensors network interface

Daniela De Venuto, David Tio Castro, Y.V. Ponomarev et al. · 2009 · 29 citations

Radar, Low-power Electronics, Electrical Engineering +12

Ultra low-power 12-bit SAR ADC for RFID applications

Daniela De Venuto, E. Stikvoort, David Tio Castro et al. · 2010 · 26 citations

Successive-approximation Adc, Engineering, Radio Frequency +16