N. Furutake

Low-power embedded ReRAM technology for IoT applications

M. Ueki, Kazuhiro Takeuchi, Takashi Yamamoto et al. · 2015 · 57 citations

Highly reliable BEOL-transistor with oxygen-controlled InGaZnO and Gate/Drain offset design for high/low voltage bridging I/O operations

K. Kaneko, N. Inoue, S. Saito et al. · 2011 · 38 citations

Bias Instabilities, Engineering, Integrated Circuits +16

Chemical Structure Effects of Ring-Type Siloxane Precursors on Properties of Plasma-Polymerized Porous SiOCH Films

Munehiro Tada, Hironori Yamamoto, Fuminori Ito et al. · Journal of The Electrochemical Society · 2007 · 33 citations

Materials Science, Chemical Engineering, Engineering +11

Improving Reliability of Copper Dual-Damascene Interconnects by Impurity Doping and Interface Strengthening

Munehiro Tada, Mari Abe, N. Furutake et al. · IEEE Transactions on Electron Devices · 2007 · 33 citations

Engineering, Impurity Doping, Chemical Deposition +17

A novel BEOL transistor (BETr) with InGaZnO embedded in Cu-interconnects for on-chip high voltage I/Os in standard CMOS LSIs

K. Kaneko, Naoya Inoue, Shinobu Saito et al. · Symposium on VLSI Technology · 2011 · 32 citations

Low-power Electronics, Electrical Engineering, Engineering +13