Yen-Pu Chen - Concepedia

Author

Yen-Pu Chen

Purdue University West Lafayette ORCID

Also Known As

Yen-Pu Chen

Publications

224

Citations

H-Index

Concepts

All Affiliations

Purdue University West Lafayette Texas Instruments (United States)

About

Yen-Pu Chen is an author at Purdue University West Lafayette specializing in engineering, applied physics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	4	4	85
2	Applied Physics	4	4	85
3	Electrical Engineering	4	4	85
4	Microelectronics	3	3	48
5	Physics	1	1	11

Yen-Pu Chen

Publications

116

Citations

H-Index

Page 1

	Year	Citations
Electrothermal performance limit of <i>β</i>-Ga2O3 field-effect transistors Bikram Kishore Mahajan, Yen-Pu Chen, Jinhyun Noh, Applied Physics Letters Wide-bandgap SemiconductorElectrical EngineeringSemiconductor DeviceEngineeringPower Device	2019	37
Positive Bias Temperature Instability and Hot Carrier Degradation of Back-End-of-Line, nm-Thick, In<sub>2</sub>O<sub>3</sub> Thin-Film Transistors Yen-Pu Chen, Mengwei Si, Bikram Kishore Mahajan, IEEE Electron Device Letters SemiconductorsSemiconductor TechnologyElectrical EngineeringEngineeringHot Carrier Degradation	2021	25
Self-Heating and Reliability-Aware “Intrinsic” Safe Operating Area of Wide Bandgap Semiconductors—An Analytical Approach Bikram Kishore Mahajan, Yen-Pu Chen, Nicolò Zagni, IEEE Transactions on Device and Materials Reliability Wide-bandgap SemiconductorEngineeringGan HemtPower Electronic SystemsPower Electronics	2021	12
A Novel ‘I-V Spectroscopy’ Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors Yen-Pu Chen, Bikram Kishore Mahajan, Dhanoop Varghese, Device ModelingSemiconductor TechnologyElectrical EngineeringEngineeringHot Carrier Degradation	2020	11
Super Single Pulse Charge Pumping Technique for Profiling Interfacial Defects Yen-Pu Chen, Bikram Kishore Mahajan, Dhanoop Varghese, IEEE Transactions on Electron Devices	2021	11
Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique Bikram Kishore Mahajan, Yen-Pu Chen, Dhanoop Varghese,	2021	10
An Analytical Model of Hot Carrier Degradation in LDMOS Transistors: Rediscovery of Universal Scaling Bikram Kishore Mahajan, Yen-Pu Chen, Muhammad A. Alam IEEE Transactions on Electron Devices	2021	10

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