J. A. Christman

Piezoelectric measurements with atomic force microscopy

J. A. Christman, R. R. Woolcott, A. I. Kingon et al. · Applied Physics Letters · 1998 · 282 citations

Engineering, Microscopy, Mechanical Engineering +17

Raman analysis of the E1 and A1 quasi-longitudinal optical and quasi-transverse optical modes in wurtzite AlN

Leah Bergman, Mitra Dutta, Cengiz M. Balkaş et al. · Journal of Applied Physics · 1999 · 81 citations

Aluminium Nitride, Optical Materials, Engineering +18

Thin films of aluminum nitride and aluminum gallium nitride for cold cathode applications

A. T. Sowers, J. A. Christman, M. D. Bremser et al. · Applied Physics Letters · 1997 · 67 citations

Materials Science, Aluminium Nitride, Electrical Engineering +13

Spatial variation of ferroelectric properties in Pb(Zr0.3, Ti0.7)O3 thin films studied by atomic force microscopy

J. A. Christman, Seung‐Hyun Kim, Hiroshi Maiwa et al. · Journal of Applied Physics · 2000 · 47 citations · Full text

Atomic Force Microscopy, Engineering, Piezoelectric Strain +18

X-ray photoelectron spectroscopy analysis of GaN/(0001)AlN and AlN/(0001)GaN growth mechanisms

Sean W. King, E.P. Carlson, R. Therrien et al. · Journal of Applied Physics · 1999 · 35 citations

Materials Science, Aluminium Nitride, Wide-bandgap Semiconductor +11