C. G. Frase

Characterization of nanoparticles by scanning electron microscopy in transmission mode

Egbert Buhr, N Senftleben, Tobias Klein et al. · Measurement Science and Technology · 2009 · 123 citations

Nanoparticles, Engineering, Microscopy +17

Traceable size determination of nanoparticles, a comparison among European metrology institutes

Felix Meli, Tobias Klein, Egbert Buhr et al. · Measurement Science and Technology · 2012 · 102 citations

CD characterization of nanostructures in SEM metrology

C. G. Frase, Egbert Buhr, Kai Dirscherl · Measurement Science and Technology · 2007 · 72 citations

Engineering, Microscopy, Cd Characterization +17

Model-based SEM for dimensional metrology tasks in semiconductor and mask industry

C. G. Frase, D. Gnieser, Harald Bosse · Journal of Physics D Applied Physics · 2009 · 59 citations

Engineering, Measurement, Microscopy +23

Traceable measurement of nanoparticle size using a scanning electron microscope in transmission mode (TSEM)

Tobias Klein, Egbert Buhr, K.-P. Johnsen et al. · Measurement Science and Technology · 2011 · 51 citations

Nanoparticles, Engineering, Microscopy +19