D. Gnieser

Characterization of nanoparticles by scanning electron microscopy in transmission mode

Egbert Buhr, N Senftleben, Tobias Klein et al. · Measurement Science and Technology · 2009 · 123 citations

Nanoparticles, Engineering, Microscopy +17

Model-based SEM for dimensional metrology tasks in semiconductor and mask industry

C. G. Frase, D. Gnieser, Harald Bosse · Journal of Physics D Applied Physics · 2009 · 59 citations

Engineering, Measurement, Microscopy +23

Electron permeable membranes for MEMS electron sources

Felix Haase, Peter Detemple, Stefan Schmitt et al. · Sensors and Actuators A Physical · 2006 · 15 citations

Chemical Engineering, Engineering, Proton-exchange Membrane +3

SEM image modeling using the modular Monte Carlo model MCSEM

K.-P. Johnsen, C. G. Frase, Harald Bosse et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2010 · 12 citations

Engineering, Microscopy, Electron Diffraction +23