M. Nanba

Observation of p-n Junctions with a Flying-Spot Scanner Using a Chopped Photon Beam

Chusuke Munakata, Kunihiro Yagi, T. Warabisako et al. · Japanese Journal of Applied Physics · 1982 · 77 citations

Engineering, Electrical Engineering, Optics +11

Effect of Si and SiO2 thermal nitridation on impurity diffusion and oxidation induced stacking fault size in Si

Shoichi Mizuo, Takahisa Kusaka, Akira Shintani et al. · Journal of Applied Physics · 1983 · 74 citations

Engineering, Materials Engineering, Materials Science +17

Dislocation Generation at Si3 N 4 Film Edges on Silicon Substrates and Viscoelastic Behavior of SiO2 Films

Seiichi Isomae, Y. Tamaki, A. Yajima et al. · Journal of The Electrochemical Society · 1979 · 51 citations

Natural Sciences, Materials Engineering, Materials Science +16

A 64 GHz Si bipolar transistor using in-situ phosphorus doped polysilicon emitter technology

M. Nanba, T. Kobayashi, T. Uchino et al. · 2002 · 32 citations

Engineering, Electrical Engineering, Microelectronics +16

Creep curve of silicon wafers

Seiichi Isomae, M. Nanba, Y. Tamaki et al. · Applied Physics Letters · 1977 · 27 citations

Natural Sciences, Materials Engineering, Materials Science +17