Petia Weih

Electrical characterization of SiC/Si heterostructures with Ge-modified interfaces

J. Pezoldt, Ch. Förster, Petia Weih et al. · Applied Surface Science · 2001 · 37 citations

Engineering, Materials Engineering, Materials Science +16

In situ spectroscopic ellipsometry of hydrogen-argon plasma cleaned silicon surfaces

Ch. Förster, F. Schnabel, Petia Weih et al. · Thin Solid Films · 2004 · 14 citations

Natural Sciences, Materials Science, Physics +15

Etching of SiC with Fluorine ECR Plasma

Christian Förster, V. Cimalla, Ratislav Kosiba et al. · Materials science forum · 2004 · 13 citations · Full text

Engineering, Materials Engineering, Materials Science +11

SIMS investigation of the influence of Ge pre‐deposition on the interface quality between SiC and Si

J. Pezoldt, Ch. Zgheib, P. Masri et al. · Surface and Interface Analysis · 2004 · 11 citations

Engineering, Materials Engineering, Materials Science +17

The role of Ge predeposition temperature in the MBE epitaxy of SiC on Ssilicon

Francisco M. Morales, Ch. Zgheib, Sergio I. Molina et al. · Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics · 2004 · 10 citations · Full text

Engineering, Materials Engineering, Materials Science +17