J. Urresti

Analysis of Clamped Inductive Turnoff Failure in Railway Traction IGBT Power Modules Under Overload Conditions

X. Perpiñà, J.F. Servière, J. Urresti et al. · IEEE Transactions on Industrial Electronics · 2010 · 55 citations

Electrical Engineering, Overload Conditions, Engineering +11

UIS failure mechanism of SiC power MOSFETs

Asad Fayyaz, Alberto Castellazzi, G. Romano et al. · 2016 · 52 citations

Reliability, Electrical Engineering, Reliability Engineering +11

A Comprehensive Study on the Avalanche Breakdown Robustness of Silicon Carbide Power MOSFETs

Asad Fayyaz, G. Romano, J. Urresti et al. · Energies · 2017 · 45 citations · Full text

Comprehensive Study, Electrical Engineering, Engineering +11

Increased Mobility in Enhancement Mode 4H-SiC MOSFET Using a Thin SiO₂/ Al₂O₃Gate Stack

Faiz Arith, J. Urresti, Konstantin Vasilevskiy et al. · IEEE Electron Device Letters · 2018 · 43 citations

Device Modeling, Semiconductors, Electrical Engineering +13

Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile

J. Roig, D. Flores, J. Urresti et al. · Microelectronics Reliability · 2004 · 39 citations

Steep Retrograde Drift, Electrical Engineering, Hot-carrier Degradation +7