Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile - Concepedia

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Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile

39

Citations

9

References

2004

Year

J. Roig, D. Flores, J. Urresti, S. Hidalgo, J. Rebollo

Microelectronics Reliability

Steep Retrograde DriftElectrical EngineeringHot-carrier DegradationEngineeringElectronic EngineeringBias Temperature InstabilitySemiconductor Device FabricationMicroelectronicsSoi Ldmos TransistorSemiconductor Device

References

	Year	Citations

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