E.F. Runnion

Demonstration of Conductive Bridging Random Access Memory (CBRAM) in logic CMOS process

C. Gopalan, Yiyi Ma, Tony Gallo et al. · Solid-State Electronics · 2010 · 125 citations

Engineering, Computer Engineering, Electrical Engineering +13

Thickness dependence of stress-induced leakage currents in silicon oxide

E.F. Runnion, S.M. Gladstone, R.S. Scott et al. · IEEE Transactions on Electron Devices · 1997 · 90 citations

Engineering, Electrical Engineering, Materials Science +17

Conductive-bridge memory (CBRAM) with excellent high-temperature retention

John R. Jameson, Paul T. Blanchard, Chiyu Cheng et al. · 2013 · 74 citations

Natural Sciences, Materials Science, Physics +15

Limitations on oxide thicknesses in flash EEPROM applications

E.F. Runnion, S.M. Gladstone, R.S. Scott et al. · 1996 · 27 citations

Engineering, Electrical Engineering, Materials Science +17

Demonstration of Conductive Bridging Random Access Memory (CBRAM) in Logic CMOS Process

C. Gopalan, Ma Yi, Tony Gallo et al. · 2010 · 21 citations

Engineering, Computer Engineering, Electrical Engineering +13