Understanding the impact of the cooling ramp of the fast-firing process on light- and elevated-temperature-induced degradation

Contactless determination of current–voltage characteristics and minority-carrier lifetimes in semiconductors from quasi-steady-state photoconductance data

Ronald A. Sinton, Andrés Cuevas · Applied Physics Letters · 1996 · 1.6K citations

Engineering, Electrical Engineering, Materials Science +17

Deactivation of the boron acceptor in silicon by hydrogen

Chih‐Tang Sah, Jack Yuan-Chen Sun, Joseph Jeng-Tao Tzou · Applied Physics Letters · 1983 · 320 citations

Engineering, Electrical Engineering, Materials Science +17

Degradation of multicrystalline silicon solar cells and modules after illumination at elevated temperature

F. Kersten, P. Engelhart, Hans-Christoph Ploigt et al. · Solar Energy Materials and Solar Cells · 2015 · 268 citations

Engineering, Materials Engineering, Materials Science +14

Very low surface recombination velocity on p-type c-Si by high-rate plasma-deposited aluminum oxide

Pierre Saint‐Cast, D. Kania, Marc Hofmann et al. · Applied Physics Letters · 2009 · 242 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Neutralization of acceptors in silicon by atomic hydrogen

J. I. Pánkové, R. O. Wance, J. E. Berkeyheiser · Applied Physics Letters · 1984 · 221 citations

Natural Sciences, Materials Science, Physics +9