Microelectronics Reliability · 2023 · 34 citations · 26 references
EngineeringElectrical EngineeringMaterials ScienceArtificial IntelligenceSemiconductor DevicesSemiconductor MaterialsCurrent-voltage CharacteristicsDevice CharacterizationDevice ModelingDevice SimulationElectronic Transport ModelingSemiconductor Device MaterialsCurrent-voltage RelationsDiode Current-voltage CharacteristicsPerformance PredictionPerformance Prediction ModelsSchottky Barrier CharacteristicsSchottky Barrier DiodesSchottky BarriersSchottky Contacts
26
Statistics of the Recombinations of Holes and Electrons
W. Shockley, W. T. Read · Physical Review · 1952 · 6.4K citations
Rebekah Hill · Physics Bulletin · 1975 · 432 citations