IEEE Transactions on Electron Devices · 1967 · 42 citations · 0 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesAvalanche ProcessesDevice ModelingDevice ReliabilityNoise In Electronic DevicesNoise In Semiconductor DevicesSemiconductor ReliabilityAvalanche BreakdownAvalanche DynamicsAvalanche NoiseImpatt DiodesNoise In Semiconductor DiodesSmall-signal ConductanceSmall-signal Diode Models