A BICS for CMOS OpAmps by Monitoring the Supply Current Peak

Analog VLSI signal processing: Why, where, and how?

Eric A. Vittoz · The Journal of VLSI Signal Processing Systems for Signal Image and Video Technology · 1994 · 158 citations

Engineering, Computer Engineering, Electrical Engineering +12

Design for testability of embedded integrated operational amplifiers

K. Arabi, Bożena Kamińska · IEEE Journal of Solid-State Circuits · 1998 · 73 citations

Engineering, Electrical Engineering, Analog Electronics +14

Effective oscillation-based test for application to a DTMF filter bank

Gloria Huertas, D. Vázquez, A. Rueda et al. · 2003 · 64 citations

Engineering, Electrical Engineering, Test Development +9

A detailed analysis and electrical modeling of gate oxide shorts in MOS transistors

J. Segura, Carol de Benito, Antonio Rubio et al. · Journal of Electronic Testing · 1996 · 38 citations

Engineering, Electrical Engineering, Microelectronics +16

Dynamic <i> I _dd </i> test circuit for mixedsignal ICs

J. Argüelles, M. Martínez, S. Bracho · Electronics Letters · 1994 · 31 citations

Engineering, Computer Engineering, Electrical Engineering +12