Carol de Benito

A detailed analysis of GOS defects in MOS transistors: testing implications at circuit level

J. Segura, Carol de Benito, Antonio Rubio et al. · 2002 · 48 citations

Device Modeling, Electrical Engineering, Engineering +15

A detailed analysis and electrical modeling of gate oxide shorts in MOS transistors

J. Segura, Carol de Benito, Antonio Rubio et al. · Journal of Electronic Testing · 1996 · 38 citations

Device Modeling, Electrical Engineering, Semiconductor Device +9

Exploring resistive switching‐based memristors in the charge–flux domain: A modeling approach

Mohamad Moner Al Chawa, Rodrigo Picos, J.B. Roldán et al. · International Journal of Circuit Theory and Applications · 2017 · 33 citations

Device Modeling, Circuit Simulators, Electrical Engineering +13

Impact of Thermal Gradients on Clock Skew and Testing

S.A. Bota, Josep L. Rosselló, Carol de Benito et al. · IEEE Design & Test of Computers · 2006 · 30 citations

Engineering, Vlsi Design, Measurement +22

A Simple Piecewise Model of Reset/Set Transitions in Bipolar ReRAM Memristive Devices

Mohamad Moner Al Chawa, Carol de Benito, Rodrigo Picos · IEEE Transactions on Circuits and Systems I Regular Papers · 2018 · 24 citations

Electrical Engineering, Engineering, Reset/set Transitions +12