Concepedia

Publication | Open Access

Positive and negative charge trapping GaN HEMTs: Interplay between thermal emission and transport-limited processes

DOIFull Paper Access

25

Citations

15

References

2021

Year

A. Nardo, Carlo De Santi, Christian Koller, Clemens Ostermaier, I. Daumiller, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
Microelectronics Reliability

References

YearCitations

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