Optimization of ITO thin film properties as a function of deposition time using the swanepoel method

Determination of the thickness and optical constants of amorphous silicon

R. Swanepoel · Journal of Physics E Scientific Instruments · 1983 · 3.9K citations

Natural Sciences, Materials Engineering, Materials Science +17

Optical properties and electronic structure of amorphous Ge and Si

J. Tauc · Materials Research Bulletin · 1968 · 3.5K citations

Natural Sciences, Materials Science, Physics +16

A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film

J.-C. Manifacier, J. Gasiot, J.P. Fillard · Journal of Physics E Scientific Instruments · 1976 · 1.7K citations

Natural Sciences, Materials Science, Optical Materials +16

Optical and electrical properties of transparent conductive ITO thin films deposited by sol–gel process

Mohammad Jahangir Alam, David Cameron · Thin Solid Films · 2000 · 329 citations

Natural Sciences, Materials Engineering, Materials Science +16

Structure, optical and electrical properties of indium tin oxide ultra thin films prepared by jet nebulizer spray pyrolysis technique

M. Thirumoorthi, J. Thomas Joseph Prakash · Journal of Asian Ceramic Societies · 2016 · 296 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17