IEEE/ACM International Conference on Computer-Aided Design · 1992 · 62 citations · 17 references
EngineeringComputer ArchitectureData PathSoftware EngineeringHigh Fault CoverageTest Data GenerationSoftware AnalysisFormal VerificationModel-based TestingEasy TestabilityTest AutomationSystems EngineeringCombinatorial OptimizationSystem TestingComputer EngineeringComputer ScienceDesign For TestingInteger ProgrammingProgram AnalysisSoftware TestingFormal MethodsBehavioral Synthesis
A data path scheduling algorithm to improve testability without assuming any particular test strategy is presented. A scheduling heuristic for easy testability, based on previous work on data path allocation for testability, is introduced. A mobility path scheduling algorithm to implement this heuristic while also minimizing area is developed. Experimental results on benchmark and example circuits show high fault coverage, short test generation time, and little or no area overhead.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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Sequential circuit design using synthesis and optimization
Ellen Sentovich, K.J. Singh, Cho W. Moon et al. · 2003 · 607 citations