IEEE Transactions on Circuits and Systems I Regular Papers · 2021 · 11 citations · 18 references
EngineeringComputer EngineeringElectrical EngineeringAnalog ElectronicsMicroelectronicsSemiconductor DevicesCmos Circuit DesignComplementary Metal-oxide-semiconductor TechnologyMemory DevicesMixed-signal Integrated Circuit DesignCmos Analog Circuit DesignCmos Analog Integrated CircuitsComplementary Metal-oxide-semiconductor DevicesEqualizationSense Amplifier DesignVoltageVoltage SensingVoltage Sensing Mechanisms
In a conventional open bit-line scheme of DRAM, the edge subarrays (MATs) located at both ends of the cell array block contain alternated real and dummy bit-lines, unavoidably leading to an additional area overhead. To reduce the area overhead, one edge MAT can be eliminated by converting the dummy bit-lines of the other edge MAT into real bit-lines. This strategy causes the conventional bit-line sense amplifiers (BLSAs) in the MATs located at both ends of the cell array block to have a much smaller complementary bit-line capacitance than a true bit-line capacitance. Thus, the sensing operation of a conventional BLSA with this unbalanced bit-line capacitance experiences various problems: sensing voltage decrease, data flipping, and asymmetric equalization. To solve these problems, we propose a novel sensing circuit that can operate effectively even under unbalanced bit-line capacitance, thus suggesting the possibility of an open bit-line scheme without dummy bit-lines. Our proposed dummy-less open bit-line scheme can save approximately 4% of the array height. Compared with the conventional unbalanced BLSA, the proposed BLSA increases the sensing voltage by more than 100%, reduces the voltage peaks by 30% during the data transfer, and reduces equalization time by 1.2 ns in HSPICE Monte Carlo simulation.
18
Adaptive-latency DRAM: Optimizing DRAM timing for the common-case
Donghyuk Lee, Yoongu Kim, Gennady Pekhimenko et al. · 2015 · 243 citations · Full text
Technology for sub-50nm DRAM and NAND flash manufacturing
Kinam Kim · 2006 · 170 citations
Engineering, Computer Engineering, Electrical Engineering +17
Limitations and challenges of multigigabit DRAM chip design
K. Itoh, Y. Nakagome, S. Kimura et al. · IEEE Journal of Solid-State Circuits · 1997 · 81 citations
Engineering, Computer Engineering, Electrical Engineering +17