Publication | Closed Access
Technology Scaling Challenge and Future Prospects of DRAM and NAND Flash Memory
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Citations
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2015
Year
Unknown Venue
Hardware SecurityScaling LimitationsElectrical EngineeringFuture ProspectsEngineeringNanoelectronicsTechnology Scaling ChallengeHigh Density DramFlash MemoryComputer ArchitectureComputer EngineeringMemory DeviceMemory ManufacturesParallel ComputingTechnologyMicroelectronicsNand Flash MemoryMemory Architecture
Memory manufactures are facing the challenges of technology scaling beyond 1xnm node DRAM and NAND flash memory. Even though we are managing to overcome patterning issue, we are still fighting against cost reduction and electrical limitation. In this paper, the scaling limitations and challenges of both DRAM and NAND are reviewed, and the future prospects with promising solutions are also addressed for high density DRAM and 3D NAND flash memory.
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