Sung-Kye Park

Device considerations for high density and highly reliable 3D NAND flash cell in near future

Eun-Seok Choi, Sung-Kye Park · 2012 · 125 citations

Technology Scaling Challenge and Future Prospects of DRAM and NAND Flash Memory

Sung-Kye Park · 2015 · 110 citations

Hardware Security, Scaling Limitations, Electrical Engineering +15

Comprehensive evaluation of early retention (fast charge loss within a few seconds) characteristics in tube-type 3-D NAND flash memory

Bongsik Choi, Sang Hyun Jang, Jinsu Yoon et al. · 2016 · 72 citations

Non-volatile Memory, Electrical Engineering, Lateral Charge Loss +13

Comprehensive analysis of retention characteristics in 3-D NAND flash memory cells with tube-type poly-Si channel structure

Ho-Jung Kang, Nagyong Choi, Sung-Min Joe et al. · 2015 · 65 citations

Engineering, Charge Transport, 3D Memory +17

A middle-1X nm NAND flash memory cell (M1X-NAND) with highly manufacturable integration technologies

Joowon Hwang, Jihyun Seo, Youngbok Lee et al. · 2011 · 38 citations

Non-volatile Memory, Engineering, Middle-1x Nm Nand +17