2020 · 46 citations · 7 references
EngineeringElectrical EngineeringPhysicsAcousticsMicrowave EngineeringSpectroscopyFrequency SelectivityHigh-frequency Semiconductor DevicesMicrowave FiltersMicrowave MeasurementsMicrowave ResonatorsBulk Mode ResonatorsDielectric ResonatorsFilter Performance EvaluationMicrowave Filter ResonatorsMole RatiosResonator CharacterizationResonator DesignResonator Quality Factor
The authors report 3.5 GHz bulk acoustic wave resonators with an observed k<;span style="font-size: 14.5px;"> <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> <;/span> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">eff</sub> in the range of 14.2 to 16%, which the authors believe to be amongst the highest reported for a Sc mole fraction of 28%. The measured Q <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">p</sub> is as high as 951 at 3.5 GHz, which is 3.8 times higher than recently reported for resonators at comparable Sc mole fractions. A high Q <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">max</sub> of 1070 combined with the high k<;span style="font-size: 14.5px;"> <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> <;/span> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">eff </sub> achieves the highest reported FOM at 158 for a Sc mole fraction of 28%. Furthermore, randomly selected 3.5 GHz devices mounted on evaluation PCB boards were power tested and damaged at CW power levels between +40 dBm and +41.5 dBm, indicating high power performance capability.
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Simon Fichtner, Niklas Wolff, Gnanavel Vaidhyanathan Krishnamurthy et al. · Journal of Applied Physics · 2017 · 146 citations
Natural Sciences, Materials Engineering, Materials Science +17
Robert Aigner, Gernot Fattinger, Michael Schaefer et al. · 2018 · 140 citations