Journal of Analytical Atomic Spectrometry · 2020 · 18 citations · 34 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsElemental AnalysisMaterials CharacterizationAlloysCalibrationElectronic Material CharacterizationNitrogenous CompoundsNitrogen Content AnalysisNitrogen Oxide MeasurementReference MaterialsStandard Reference Materials
Result of measured N-content in test set of Ge<sub>2</sub>Sb<sub>2</sub>Te<sub>5</sub>:N samples. XRF calibrated using a set of reference materials certified by IBA.
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Interfacial phase-change memory
Robert E. Simpson, Paul Fons, Alexander V. Kolobov et al. · Nature Nanotechnology · 2011 · 758 citations