C. Jeynes

Simulated annealing analysis of Rutherford backscattering data

N.P. Barradas, C. Jeynes, R.P. Webb · Applied Physics Letters · 1997 · 633 citations

Engineering, Data Collection Time, Physics +8

Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool

C. Jeynes, N.P. Barradas, Paul Marriott et al. · Journal of Physics D Applied Physics · 2003 · 183 citations

Advanced physics and algorithms in the IBA DataFurnace

N.P. Barradas, C. Jeynes · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2007 · 179 citations

Numerical Analysis, Engineering, Computational Model +4

Critical review of the current status of thickness measurements for ultrathin SiO ₂ on Si Part V: Results of a CCQM pilot study

M. P. Seah, Steven J. Spencer, Farid Bensebaa et al. · Surface and Interface Analysis · 2004 · 139 citations

“Total IBA” – Where are we?

C. Jeynes, Melanie J. Bailey, Nicholas J. Bright et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2011 · 118 citations

Global Studies, International Financial Architecture