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Large-band-gap SiC, III-V nitride, and II-VI ZnSe-based semiconductor device technologies

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Thermal conductivity measurement from 30 to 750 K: the 3ω method

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Engineering, Measurement, Education +20

The Scattering of Low-Frequency Lattice Waves by Static Imperfections

P. G. Klemens · Proceedings of the Physical Society Section A · 1955 · 1.4K citations

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