Acta Metallurgica Sinica (English Letters) · 2019 · 18 citations · 13 references
Natural SciencesMaterials EngineeringMaterials ScienceMechanical Behavior Of MaterialsDielectric CeramicsDielectric MaterialsDielectric PropertiesDielectricsResidual StressStrain HardeningBrittle FailureDielectric StrengthLow-k DielectricsPillar Stress DistributionStress Optimization
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Investigation of Cu/Low-K Film Delamination in Flip-Chip Packages
Charlie Jun Zhai, U. Ozkan, A. DubeySidharth et al. · 2006 · 45 citations
Studies on a novel flip-chip interconnect structure. Pillar bump
Tengfei Wang, Fletcher Tung, L. Foo et al. · 2002 · 44 citations