Concepedia

Single Event Upset Results from the Radiation Hardened Electronic Memory Experiment on the International Space Station

David Alexander, Alonzo Vera, Wesley Morris, James F. Christian, David Gifford, Keith Avery, Gabriel V. Urbaitis, Connie Li, Zack Daniels

2018 · 12 citations · 3 references

Concepts

MedicineElectrical EngineeringFault ToleranceMemoryRadiation PhysicsHigh-dose Radiation EffectsRadiation HardeningRadiation SensitivityRadiation TestingRadiation-hardened Integrated CircuitsRadiation-hardened MemoryRadiation-hardened Memory DevicesSingle Event EffectsSingle Event Upset Modeling

Abstract

Results are presented from the Radiation Hardened Electronic Memory Experiment (RHEME) performed on the International Space Station (ISS).

References

3