2018 · 10 citations · 5 references
EngineeringAerospace EngineeringInstrumentationNuclear InstrumentationSpacecraft DesignDetector SystemsDevice CharacterizationHeavy-ion PhysicsHighly Charged IonsInterplanetary Spacecraft DesignComponent-level Radiation TestingHeavy Ion RadiationHeavy-ion AcceleratorsRadiation TestingSingle Event EffectsSingle Event Upset Modeling
This paper presents recent heavy ion single-event effects test results for commercial off the shelf devices. Data was taken in CY17 for device evaluation for use in a Class D NASA interplanetary mission payload.
5
The effect of temperature on single-particle latchup
A.H. Johnston, B.W. Hughlock, M.P. Baze et al. · IEEE Transactions on Nuclear Science · 1991 · 78 citations
Engineering, Computer Engineering, Electrical Engineering +12