Electrochemistry Communications · 2018 · 31 citations · 18 references
Natural SciencesMaterials EngineeringMaterials ScienceElectrochemistryElectronic MaterialsSurface ScienceElectrochemical TreatmentElectrode-electrolyte InterfacesElectrolyte MaterialsRedox-active MaterialsSemiconductor Device MaterialsSurface OxidationElectrochemical OxidationElectrochemical Surface EngineeringElectrochemical Surface FinishingGallium Nitride (Gan) MaterialsGan-based High-frequency DevicesOxide Film FormationSemiconductor Surface PreparationSurface Oxidation Mechanisms
Gallium nitride and related materials possess advantageous physical and electrical characteristics for use in high-power/frequency devices and optoelectronics. However, surface preparation of GaN, such as oxidizing and etching, remains difficult owing to its superior chemical and thermal stability compared to conventional semiconductor materials. Thus, high-temperature treatment or ultraviolet irradiation is required to process the GaN surface. Here, we report a novel electrochemical approach for the oxidization of GaN surface using solid polymer electrolyte (SPE), which provides a room-temperature surface treatment free from liquid electrolyte and UV irradiation. The electrochemical system composed of GaN/SPE/cathode can effectively oxidize the GaN surface (~80 nm, 10 min) in the presence of H2O molecules via a reaction with hydroxyl radicals (OH) generated on the SPE membrane. While the surface shows rough and porous features after the removal of oxide by dipping in an alkaline solution, post-oxidation polishing using CeO2 particles removes the oxide film to produce a smooth GaN surface, which demonstrates the potential of oxidation/polishing for GaN wafer fabrication processes. Keywords: Gallium nitride, Solid polymer electrolyte, Electrochemical oxidation, Polishing
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Junji Murata, Koushi Yodogawa, Kazuma Ban · International Journal of Machine Tools and Manufacture · 2016 · 122 citations
Deep ultraviolet enhanced wet chemical etching of gallium nitride
L.-H. Peng, C.-W. Chuang, J.-K. Ho et al. · Applied Physics Letters · 1998 · 111 citations
Natural Sciences, Materials Engineering, Materials Science +16