Random laser based method for direct measurement of scattering properties

Abstract

Optical sensing is a very important method for investigating different kinds of samples. Recently, we proposed a new kind of optical sensor based on random lasing [ Sci. Rep.6, 35225 (2016)], that couples the advantages of stimulated emission in detecting small variations on scattering properties of a sensed material, to the needs of no alteration of the sample under investigation. Here, we present a method to achieve a quantitative measurement of the scattering properties of a material. The results on samples of calibrated microspheres show a dependence of the peak intensity of the emission spectrum on the transport mean free path of the light within the sample, whatever the dimension (down to ≈100 nm of particle diameter) and the concentration of scatterers dispersed in the sensed material. A direct and fast measurement of the scattering properties is obtained by calibration with a well-known and inexpensive reference medium.