Concepedia
Microelectronics Reliability · 2018 · 11 citations · 12 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials CharacterizationMechanical Behavior Of MaterialsShear PropertiesShear StrengthDirect Shear TestingShear Properties Of AdhesivesShear Testing
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Growth behavior of Cu/Al intermetallic compounds and cracks in copper ball bonds during isothermal aging
C.J. Hang, Chunqing Wang, M. Mayer et al. · Microelectronics Reliability · 2007 · 244 citations
Natural Sciences, Materials Engineering, Materials Science +13
A re-examination of the mechanism of thermosonic copper ball bonding on aluminium metallization pads
Huining Xu, C. Liu, Vadim V. Silberschmidt et al. · Scripta Materialia · 2009 · 100 citations · Full text
Engineering, Materials Engineering, Materials Science +13
A micromechanism study of thermosonic gold wire bonding on aluminum pad
Huining Xu, C. Liu, Vadim V. Silberschmidt et al. · Journal of Applied Physics · 2010 · 71 citations · Full text
Natural Sciences, Materials Engineering, Materials Science +17
Theoretical and experimental analyses of atom diffusion characteristics on wire bonding interfaces
Junhui Li, Lei Han, Jue Zhong · Journal of Physics D Applied Physics · 2008 · 39 citations
Interdiffusion in copper–aluminum thin film bilayers. II. Analysis of marker motion during sequential compound formation
H. T. G. Hentzell, K. N. Tu · Journal of Applied Physics · 1983 · 37 citations