Concepedia

Publication | Open Access

Laser-assisted atom probe tomography of semiconductors: The impact of the focused-ion beam specimen preparation

DOIFull Paper Access

17

Citations

24

References

2018

Year

Janusz Bogdanowicz, Archana Praveen Kumar, Claudia Fleischmann, M. Gilbert, Jonathan Houard, Angela Vella, Wilfried Vandervorst
Ultramicroscopy

References

YearCitations

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