Highly-stable black phosphorus field-effect transistors with low density of oxide traps - Concepedia

Concepedia

Publication | Open Access

Highly-stable black phosphorus field-effect transistors with low density of oxide traps

DOI Full Paper Access

73

Citations

40

References

2017

Year

Yu. Yu. Illarionov, Michael Waltl, G. Rzepa, Theresia Knobloch, Joon‐Seok Kim, Deji Akinwande, Tibor Grasser

npj 2D Materials and Applications

References

	Year	Citations

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