A new threshold selection method for X-ray computed tomography for dimensional metrology

Computed tomography for dimensional metrology

Jean‐Pierre Kruth, Markus Bartscher, Simone Carmignato et al. · CIRP Annals · 2011 · 672 citations

Engineering, Manufacturing Engineering, Biomedical Imaging +11

Industrial applications of computed tomography

Leonardo De Chiffre, Simone Carmignato, Jean‐Pierre Kruth et al. · CIRP Annals · 2014 · 649 citations

Engineering, Industrial Engineering, Manufacturing Engineering +12

A 3D edge detection technique for surface extraction in computed tomography for dimensional metrology applications

José A. Yagüe‐Fabra, S. Ontiveros, Roberto Jiménez et al. · CIRP Annals · 2013 · 82 citations

Engineering, Biomedical Engineering, Computational Geometry +16

A test object with parallel grooves for calibration and accuracy assessment of industrial computed tomography (CT) metrology

Kim Kiekens, Frank Welkenhuyzen, Yunhua Tan et al. · Measurement Science and Technology · 2011 · 79 citations

Engineering, Manufacturing Engineering, Biomedical Imaging +15

Testing of x-ray microtomography systems using a traceable geometrical standard

Simone Carmignato, Diego Dreossi, Lucia Mancini et al. · Measurement Science and Technology · 2009 · 66 citations

Engineering, Manufacturing Engineering, Biomedical Imaging +14