Kim Kiekens

A test object with parallel grooves for calibration and accuracy assessment of industrial CT metrology

Kim Kiekens, Frank Welkenhuyzen, Ye Tan et al. · 2011 · 234 citations

Engineering, Manufacturing Engineering, Instrumentation +11

A test object with parallel grooves for calibration and accuracy assessment of industrial computed tomography (CT) metrology

Kim Kiekens, Frank Welkenhuyzen, Yunhua Tan et al. · Measurement Science and Technology · 2011 · 79 citations

Engineering, Manufacturing Engineering, Biomedical Imaging +15

Sense and non-sense of beam hardening correction in CT metrology

Wim Dewulf, Ye Tan, Kim Kiekens · CIRP Annals · 2012 · 73 citations

Engineering, Radiology, Diagnostic Imaging +9

Uncertainty determination and quantification for dimensional measurements with industrial computed tomography

Wim Dewulf, Kim Kiekens, Ye Tan et al. · CIRP Annals · 2013 · 70 citations

Engineering, Industrial Engineering, Manufacturing Engineering +14

Industrial computer tomography for dimensional metrology: Overview of influence factors and improvement strategies

Frank Welkenhuyzen, Kim Kiekens, Mieke Pierlet et al. · Lirias (KU Leuven) · 2009 · 57 citations · Full text

Engineering, Industrial Engineering, Manufacturing Engineering +17