Ye Tan

A test object with parallel grooves for calibration and accuracy assessment of industrial CT metrology

Kim Kiekens, Frank Welkenhuyzen, Ye Tan et al. · 2011 · 234 citations

Engineering, Manufacturing Engineering, Instrumentation +11

Sense and non-sense of beam hardening correction in CT metrology

Wim Dewulf, Ye Tan, Kim Kiekens · CIRP Annals · 2012 · 73 citations

Engineering, Radiology, Diagnostic Imaging +9

Uncertainty determination and quantification for dimensional measurements with industrial computed tomography

Wim Dewulf, Kim Kiekens, Ye Tan et al. · CIRP Annals · 2013 · 70 citations

Engineering, Industrial Engineering, Manufacturing Engineering +14

Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology

Ye Tan, Kim Kiekens, Frank Welkenhuyzen et al. · Measurement Science and Technology · 2014 · 27 citations · Full text

Engineering, Mechanical Engineering, Materials Characterization +11

Beam hardening correction and its influence on the measurement accuracy and repeatability for CT dimensional metrology applications

Ye Tan, Kim Kiekens, Frank Welkenhuyzen et al. · Lirias (KU Leuven) · 2012 · 16 citations · Full text

Engineering, Radiology, Diagnostic Radiology +11