Ceramics International · 2017 · 34 citations · 52 references
Materials ScienceMaterials EngineeringMaterial AnalysisEngineeringOxide ElectronicsSurface ScienceApplied PhysicsHighly ConductingSemiconductor MaterialThin FilmsTransparent AntimonyThin Film Processing
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The Scherrer Formula for X-Ray Particle Size Determination
A. L. Patterson · Physical Review · 1939 · 8.7K citations
Thin Films—Interdiffusion and Reactions
J. M. Poate, K. N. Tu, Jean-Claude Mayor et al. · Journal of The Electrochemical Society · 1979 · 1.7K citations